Defect

Defect in United States

Defect Definition

The want of something required by law. See 20 N. Y. 355; 40 Barb. (N. Y.) 574.

Defect in Foreign Legal Encyclopedias

Link Description
Defect Defect in the World Legal Encyclopedia.
Defect Defect in the European Legal Encyclopedia.
Defect Defect in the Asian Legal Encyclopedia.
Defect Defect in the UK Legal Encyclopedia.
Defect Defect in the Australian Legal Encyclopedia.

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Browse the American Encyclopedia of Law for Defect

Scan Defect in the appropriate area of law:

Link Description
Defect Defect in the Family Law Portal of the American Encyclopedia of Law.
Defect Defect in the IP Portal of the American Encyclopedia of Law.
Defect Defect in the Commercial Law Portal of the American Encyclopedia of Law.
Defect Defect in the Criminal Law Portal of the American Encyclopedia of Law.
Defect Defect in the Antritrust Portal of the American Encyclopedia of Law.
Defect Defect in the Bankruptcy Law Portal of the American Encyclopedia of Law.
Defect Defect in the Constitutional Law Portal of the American Encyclopedia of Law.
Defect Defect in the Tax Law Portal of the American Encyclopedia of Law.
Defect Defect in the and Finance and Banking Portal of the American Encyclopedia of Law.
Defect Defect in the Employment and Labor Portal of the American Encyclopedia of Law.
Defect Defect in the Personal Injury and Tort Portal of the American Encyclopedia of Law.
Defect Defect in the Environmental Law Portal of the American Encyclopedia of Law.

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Explore other Reference Works

Resource Description
Defect in the Dictionaries Defect in our legal dictionaries
http://lawi.us/defect The URI of Defect (more about URIs)
Defect related entries Find related entries of Defect

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Legal Issue for Attorneys

The want of something required by law. See 20 N. Y. 355; 40 Barb. (N. Y.) 574.

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Notice

This definition of Defect Is based on the The Cyclopedic Law Dictionary . This definition needs to be proofread..

Resources

See Also

  • Legal Topics.
  • Further Reading (Articles)

    Defects Liability Period: An Introduction, Mondaq Business Briefing; February 4, 2013

    “Defect Form Quality Indication” in Patent Application Approval Process, Politics & Government Week; February 7, 2013

    Birth defects, International Journal of Childbirth Education; September 1, 2001; King, Dale

    Defect Reduction in a High-Volume Fab., Semiconductor International; July 1, 2001; Ben-Porath, Ariel

    “Defect Closure” in Patent Application Approval Process, Politics & Government Week; January 24, 2013;

    Latent Defects: Key Issues., Mondaq Business Briefing; April 23, 2012; Sorohan, Amelia

    A Measuring Method of Steel Plate Defect Uncertain Correlation Information Based on Rough Set and Functional Dependency, Sensors & Transducers; May 1, 2013; Liu, Junwei Kong, Jianyi Wang, Xingdong

    Epithelial defects linked to thicker corneas, Ophthalmology Times; September 1, 2001; Talsma, Julia

    Patent Application Titled “Defect Classification Apparatus” Published Online, Politics & Government Week; July 25, 2013

    Fabric Defect Detection Using Adaptive Dictionaries, Textile Research Journal; October 1, 2013; Zhou, Jian Wang, Jun

    Birth Defects Are More Common Than You Think, US Fed News Service, Including US State News; January 25, 2014

    Birth defects surveillance registries in the United States and Europe, International Journal of Childbirth Education; March 1, 1999; Bar-Yam, Naomi Bromberg

    Birth Defects, Child Development; January 1, 2002

    Neural Tube Defects, Gale Encyclopedia of Genetic Disorders; January 1, 2005

    Defect-detection strategies: today’s operations require a high-speed 3-D approach.(X-Ray Inspection), Circuits Assembly; May 1, 2007; Benson, James

    Defect Detection Drives to Greater Depths., Semiconductor International; August 1, 2009

    Automotive coatings defects Part 1: in-plant and field defects.(Technology Today), JCT CoatingsTech; February 1, 2004; Schoff, Clifford K.

    Defect Detection Faces Smaller, Deadlier Hurdles., Semiconductor International; April 1, 2007; Braun, Alexander E.

    “Wiring Defect Inspecting Method, Wiring Defect Inspecting Apparatus, and Method for Manufacturing Semiconductor Substrate” in Patent Application Approval Process, Electronics Newsweekly; March 26, 2014

    “Defect Inspection Method and Defect Inspection Device” in Patent Application Approval Process, Politics & Government Week; November 28, 2013


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