Defect in United States
Defect Definition
The want of something required by law. See 20 N. Y. 355; 40 Barb. (N. Y.) 574.
Defect in Foreign Legal Encyclopedias
Link | Description |
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Defect | Defect in the World Legal Encyclopedia. |
Defect | Defect in the European Legal Encyclopedia. |
Defect | Defect in the Asian Legal Encyclopedia. |
Defect | Defect in the UK Legal Encyclopedia. |
Defect | Defect in the Australian Legal Encyclopedia. |
For starting research in the law of a foreign country:
Browse the American Encyclopedia of Law for Defect
Scan Defect in the appropriate area of law:
Link | Description |
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Defect | Defect in the Family Law Portal of the American Encyclopedia of Law. |
Defect | Defect in the IP Portal of the American Encyclopedia of Law. |
Defect | Defect in the Commercial Law Portal of the American Encyclopedia of Law. |
Defect | Defect in the Criminal Law Portal of the American Encyclopedia of Law. |
Defect | Defect in the Antritrust Portal of the American Encyclopedia of Law. |
Defect | Defect in the Bankruptcy Law Portal of the American Encyclopedia of Law. |
Defect | Defect in the Constitutional Law Portal of the American Encyclopedia of Law. |
Defect | Defect in the Tax Law Portal of the American Encyclopedia of Law. |
Defect | Defect in the and Finance and Banking Portal of the American Encyclopedia of Law. |
Defect | Defect in the Employment and Labor Portal of the American Encyclopedia of Law. |
Defect | Defect in the Personal Injury and Tort Portal of the American Encyclopedia of Law. |
Defect | Defect in the Environmental Law Portal of the American Encyclopedia of Law. |
Explore other Reference Works
Resource | Description |
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Defect in the Dictionaries | Defect in our legal dictionaries |
http://lawi.us/defect | The URI of Defect (more about URIs) |
Defect related entries | Find related entries of Defect |
Legal Issue for Attorneys
The want of something required by law. See 20 N. Y. 355; 40 Barb. (N. Y.) 574.
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Notice
This definition of Defect Is based on the The Cyclopedic Law Dictionary . This definition needs to be proofread..
Resources
See Also
Further Reading (Articles)
Defects Liability Period: An Introduction, Mondaq Business Briefing; February 4, 2013
“Defect Form Quality Indication” in Patent Application Approval Process, Politics & Government Week; February 7, 2013
Birth defects, International Journal of Childbirth Education; September 1, 2001; King, Dale
Defect Reduction in a High-Volume Fab., Semiconductor International; July 1, 2001; Ben-Porath, Ariel
“Defect Closure” in Patent Application Approval Process, Politics & Government Week; January 24, 2013;
Latent Defects: Key Issues., Mondaq Business Briefing; April 23, 2012; Sorohan, Amelia
A Measuring Method of Steel Plate Defect Uncertain Correlation Information Based on Rough Set and Functional Dependency, Sensors & Transducers; May 1, 2013; Liu, Junwei Kong, Jianyi Wang, Xingdong
Epithelial defects linked to thicker corneas, Ophthalmology Times; September 1, 2001; Talsma, Julia
Patent Application Titled “Defect Classification Apparatus” Published Online, Politics & Government Week; July 25, 2013
Fabric Defect Detection Using Adaptive Dictionaries, Textile Research Journal; October 1, 2013; Zhou, Jian Wang, Jun
Birth Defects Are More Common Than You Think, US Fed News Service, Including US State News; January 25, 2014
Birth defects surveillance registries in the United States and Europe, International Journal of Childbirth Education; March 1, 1999; Bar-Yam, Naomi Bromberg
Birth Defects, Child Development; January 1, 2002
Neural Tube Defects, Gale Encyclopedia of Genetic Disorders; January 1, 2005
Defect-detection strategies: today’s operations require a high-speed 3-D approach.(X-Ray Inspection), Circuits Assembly; May 1, 2007; Benson, James
Defect Detection Drives to Greater Depths., Semiconductor International; August 1, 2009
Automotive coatings defects Part 1: in-plant and field defects.(Technology Today), JCT CoatingsTech; February 1, 2004; Schoff, Clifford K.
Defect Detection Faces Smaller, Deadlier Hurdles., Semiconductor International; April 1, 2007; Braun, Alexander E.
“Wiring Defect Inspecting Method, Wiring Defect Inspecting Apparatus, and Method for Manufacturing Semiconductor Substrate” in Patent Application Approval Process, Electronics Newsweekly; March 26, 2014
“Defect Inspection Method and Defect Inspection Device” in Patent Application Approval Process, Politics & Government Week; November 28, 2013
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